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ELE 714

System Testing and Design-for-Testability

This course deals with the detection and correction of faults and errors in digital circuits and systems. Major topics include digital circuit test methodologies from algorithms to gate/transistor-level designs, faults in combinational and sequential circuits including test-generation algorithms, measurement and calibration, error classification at the circuit level and solutions to detect and remove errors, digital system design and testing, identification of the sources of faults at the system level including power lines, memory testing, and input / output testing, built-in self-test techniques, and design-for-testability methods at system level design.
Weekly Contact: Lab: 2 hrs. Lecture: 3 hrs.
GPA Weight: 1.00
Course Count: 1.00
Billing Units: 1


ELE 504 and ELE 635 and ELE 639





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*List may not include courses that are on a common table shared between programs.